发明名称 |
Micro compliant interconnect apparatus for integrated circuit devices |
摘要 |
A micro compliant, test probe interconnect apparatus for an integrated circuit device is disclosed. In an exemplary embodiment, the apparatus includes an elongated housing and a probe pin extending from a first end of the housing. A biasing mechanism holds the probe pin in a normally extended position, wherein the biasing mechanism is formed from a portion of the elongated housing. In a preferred embodiment, the biasing mechanism is a flexible tab, formed from a generally rectangular section of the elongated housing and bent inwardly therein to form a cantilever.
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申请公布号 |
US6674297(B1) |
申请公布日期 |
2004.01.06 |
申请号 |
US20020193006 |
申请日期 |
2002.07.09 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
FLORENCE, JR. ROBERT F.;LOPERGOLO EMANUELE F.;MULLIGAN VINCENT P.;TOMPKINS, JR. CHARLES R. |
分类号 |
G01R1/067;G01R1/073;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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