发明名称 Semiconductor element and semiconductor memory device using the same
摘要 A field-effect semiconductor element implemented with a fewer number of elements and a reduced area and capable of storing data by itself without need for cooling at a cryogenic temperature, and a memory device employing the same. Gate-channel capacitance is set so small that whether or not a trap captures one electron or hole can definitely and distinctively be detected in terms of changes of a current of the semiconductor FET element. By detecting a change in a threshold voltage of the semiconductor element brought about by trapping of electron or hole in the trap, data storage can be realized at a room temperature.
申请公布号 US6674117(B2) 申请公布日期 2004.01.06
申请号 US20010915588 申请日期 2001.07.27
申请人 HITACHI, LTD. 发明人 YANO KAZUO;ISHII TOMOYUKI;HASHIMOTO TAKASHI;SEKI KOICHI;AOKI MASAKAZU;SAKATA TAKESHI;NAKAGOME YOSHINOBU;TAKEUCHI KAN
分类号 H01L21/8247;G11C11/22;G11C11/404;G11C16/02;G11C16/04;G11C16/28;H01L21/28;H01L21/336;H01L27/01;H01L27/115;H01L29/423;H01L29/51;H01L29/66;H01L29/76;H01L29/788;H01L29/792;H01L29/94;H01L31/036;H01L31/062;H01L31/112;H01L31/113;(IPC1-7):H01L29/76 主分类号 H01L21/8247
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