发明名称 |
Method for testing a semiconductor integrated circuit when a difference between two consecutive current exceeds a threshold value |
摘要 |
In a method of testing a semiconductor integrated circuit, setting of a logical state of elements that constitute a semiconductor integrated circuit to be measured is sequentially changed. The current from a static-time power source current passing through the elements is measured several times while the settings are changed. Any two consecutive currents are obtained. When the difference between the two consecutive current exceeds a threshold value it is determined that the semiconductor integrated circuit is defective.
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申请公布号 |
US6674300(B2) |
申请公布日期 |
2004.01.06 |
申请号 |
US20020205311 |
申请日期 |
2002.07.26 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
INOSHITA CHIZURU;AOKI KAZUO |
分类号 |
G01R31/317;G01R31/26;G01R31/30;H01L21/66;(IPC1-7):G01R31/28;G06F11/00 |
主分类号 |
G01R31/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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