发明名称 |
Method for measuring magnetic field based on electro-optic probing technique and measuring electric field based on magnetic probing technique |
摘要 |
The present invention provides a method for measuring both magnetic and electric fields of a DUT via an electro-optic probing technique at the same time. Also, the present invention provides a method for measuring both electric and magnetic fields via a magneto-optic probing technique simultaneously. The method utilizes the modulation of the position of a probe to measure the electric and magnetic field signals. The DC and AC components of the modulated electric (or magnetic) field signals can be obtained by means of a low pass filter and a lock-in amplifier, respectively. Through a simple calculation, the electric and magnetic field can be obtained simultaneously.
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申请公布号 |
US6674281(B2) |
申请公布日期 |
2004.01.06 |
申请号 |
US20020100382 |
申请日期 |
2002.03.18 |
申请人 |
PRECISION INSTRUMENT DEVELOPMENT CENTER NATIONAL SCIENCE COUNCIL |
发明人 |
SHIEH KUEN-WEY |
分类号 |
G01R33/032;(IPC1-7):G01R33/032;G01R31/308 |
主分类号 |
G01R33/032 |
代理机构 |
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