发明名称 EXTREME ULTRAVIOLET MASK WITH IMPROVED ABSORBER
摘要 <p>The present invention discloses an EUV mask having an improved absorber layer with a certain thickness that is formed from a metal and a nonmetal in which the ratio of the metal to the nonmetal changes through the thickness of the improved absorber layer and a method of forming such an EUV mask.</p>
申请公布号 EP1373978(A2) 申请公布日期 2004.01.02
申请号 EP20020721056 申请日期 2002.02.14
申请人 INTEL CORPORATION 发明人 ZHANG, GUOJING;YAN, PEI-YANG
分类号 B82Y10/00;G03F1/22;G03F1/24;G03F1/54;(IPC1-7):G03F1/14;G03F1/08 主分类号 B82Y10/00
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