X-ray diffractometer comprising a C-arm for examining an array of crystals

摘要

A crystal evaluating device including a sample stage on which an X-ray permeable sample holder 40 having at least one crystal sample mounted therein can be mounted in a substantially horizontal position, an X-ray irradiating unit 20 for irradiating X-rays to the crystal sample in the sample holder 40 disposed on the sample stage from an upper side or lower side, and an X-ray detector 30 for detecting diffracted X-rays from the crystal sample. The X-ray irradiating unit 20 and the X-ray detector 30 are mounted on a rotational arm 50 which can be rotated around the substantially horizontal axis by a rotational driving mechanism 51. <IMAGE>