| 摘要 |
A decoding circuit for a wafer burn-in test internally generates a strobe signal during the wafer burn-in test by using external input address signals, thereby decreasing the number of input pads required to receive external input strobe address signals. A plurality of pulse generating units respectively delay and logically combine a plurality of external input address signals to generate pulses. Thereafter, an internal strobe signal is generated by respectively delaying and logically operating the pulses from the pulse generating units.
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