发明名称 Fluxless bumping process using ions
摘要 A process including providing a semiconductor device including a bond pad, and an under bump metallurgy overlying the bond pad. Forming a solder structure over the under bump metallurgy, and wherein the solder structure includes an outer layer including tin oxide. Producing a plasma from at least one of CF4, SF4, and H2 and exposing the solder structure to the plasma. Heating the solder structure and cooling the same to provide a solder bump on the semiconductor device.
申请公布号 US2004000580(A1) 申请公布日期 2004.01.01
申请号 US20020184182 申请日期 2002.06.27
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LEE HSIN-HUI;LIN CHIA-FU;SU CHAO-YUAN;CHEN YENG-MING;CHING KAI-MING;CHEN LI-CHIH;TIEN HAO-CHIH
分类号 B23K1/008;H01L21/48;H01L21/60;H05K3/34;(IPC1-7):B23K31/02 主分类号 B23K1/008
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