发明名称 Method for fabricating raised source/drain of semiconductor device
摘要 A method for fabricating a raised source/drain of a semiconductor device is described. A gate structure is formed on a substrate, and then a source/drain with a shallow-junction is formed in the substrate beside the gate structure. A spacer is formed on the sidewalls of the gate structure. Thereafter, an elevated layer is formed on the gate structure and the source/drain with a shallow junction, wherein the elevated layer formed on the source/drain serves as an elevated source/drain layer.
申请公布号 US2004002194(A1) 申请公布日期 2004.01.01
申请号 US20020064561 申请日期 2002.07.26
申请人 CHANG KENT KUOHUA 发明人 CHANG KENT KUOHUA
分类号 H01L21/285;H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/285
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