发明名称 CHECK VALVE FOR FABRICATING SEMICONDUCTOR
摘要 PURPOSE: A check valve for fabricating a semiconductor is provided to prevent a chamber contamination caused by the particles that could be transferred from a vacuum pump to the chamber with a plate that can seal a chamber port by the elastic force of a spring when the vacuum pump malfunctions. CONSTITUTION: The first port is coupled to the chamber. The second port is coupled to a pump for maintaining the vacuum of the chamber. A housing includes the first and second ports. The plate(30) opens and closes the first port. One end of an elastic member is coupled to the plate. The plate is closely attached to the first port by the elastic force of an elastic member and is separated from the first port when the pump operates.
申请公布号 KR20030097452(A) 申请公布日期 2003.12.31
申请号 KR20020034826 申请日期 2002.06.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO, CHANG MUK;CHUN, JEONG GU;YEO, SANG HUN
分类号 H01L21/02;(IPC1-7):H01L21/02 主分类号 H01L21/02
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