发明名称 SPUTTER TARGET MONITORING SYSTEM
摘要 <p>A sputtering target monitoring sytem (20) for monitoring the status of a sputtering source target (22) during the sputtering process. The collection of data is initiated based on measured voltages in the sputtering source target (22), whereas the arcing count is determined based on current spikes or interruptions to the current in the sputtering source target (22) during the sputtering process. The real time data collected during the sputtering process is recorded and displayed in table or graphical format at any time during the sputtering process. Thus, problems in the sputtering process, or in the sputtering source (22), including an approaching end of life of the target may be easily ascertained. Alarms, messages or other indicators may be used to alert operators to problems or conditions during the sputtering process.</p>
申请公布号 WO2004001094(A1) 申请公布日期 2003.12.31
申请号 WO2003US19740 申请日期 2003.06.10
申请人 TOSOH SMD INC;POOLE JOHN E;WICKERSHAM CHARLES E JR 发明人 POOLE JOHN E;WICKERSHAM CHARLES E JR
分类号 C23C14/32;C23C14/34;C23C14/54;H01J37/34;(IPC1-7):C23C14/34 主分类号 C23C14/32
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