发明名称 PHOTO MASK, FABRICATING METHOD THEREOF AND METHOD FOR FABRICATING PHOTORESIST LAYER USING THE SAME
摘要 PURPOSE: A photo mask is provided to uniformly fabricate a photoresist layer pattern by forming a photo mask while using a mask layer and a phase shift layer and by changing a mask pattern. CONSTITUTION: The photo mask(120) has an exposure region(116) of an isolated pattern type. The mask layer(114) is formed in the whole peripheral region of a short side of the exposure region and in a predetermined portion of a peripheral region of the long side of the exposure region. The phase shift layer(112) is formed in the peripheral region of the long side except the predetermined region wherein the mask layer is formed.
申请公布号 KR20030097151(A) 申请公布日期 2003.12.31
申请号 KR20020034329 申请日期 2002.06.19
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HONG, JI SEOK
分类号 H01L21/027;G03F1/00;G03F1/14 主分类号 H01L21/027
代理机构 代理人
主权项
地址