发明名称 DEVICE AND METHOD FOR TESTING COMPUTER SYSTEM USING FPGA AND PROGRAMMABLE MEMORY MODULES
摘要 PURPOSE: A device and a method for testing a computer system using an FPGA(Field Programmable Gate Array) and programmable memory modules are provided to remove a manual access work for replacing an EPROM(Erasable Programmable Read Only Memory) module and to reduce a time needed to test the computer system by embedding with the EPROM modules storing the configuration data of each version. CONSTITUTION: The device includes a controller(110), the FPGA(120), a system bus(115), an EPROM module part(130), an EPROM controller(135), a PCI(Peripheral Component Interconnect) slot(140), a PCI bus(145), a memory interface card(150), a system clock circuit(160), an UART(Universal Asynchronous Receiver/Transmitter) part(170), and a reset circuit(180). The FPGA is programmed by the data, which is stored in the EPROM, selected from the EPROM module part. The EPROM module part includes the EPROM modules(131,132,133) respectively storing the coded information for the components of the FPGA. Respective EPROM modules store the configuration data of a peripheral device by each version.
申请公布号 KR20030096657(A) 申请公布日期 2003.12.31
申请号 KR20020033636 申请日期 2002.06.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOON, YEONG SIK
分类号 G01R31/00;G06F11/22;G06F11/267;G06F11/273;(IPC1-7):G06F11/22 主分类号 G01R31/00
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