发明名称 POLISHING STATION OF CHEMICAL MECHANICAL POLISHING APPARATUS
摘要 PURPOSE: A polishing station of a chemical mechanical polishing(CMP) apparatus is provided to prevent a wafer unloading error by stably unloading a semiconductor wafer from a transfer stage. CONSTITUTION: A turntable on which a polishing pad is mounted is formed on a polishing station. A polishing head(162) has a membrane(168) whose surface contacts the wafer, maintaining the wafer and pressing the wafer over the turntable. The polishing station includes a wafer transfer stage(120) for loading/unloading the wafer into/from the polishing head. The wafer transfer stage includes a pedestal(122) and a fluid supply apparatus. The wafer is placed on the pedestal. When the wafer is unloaded from the polishing head to the pedestal, the fluid supply apparatus supplies fluid to a gap between the wafer and the membrane to reduce the surface tension between the wafer and the membrane.
申请公布号 KR20030097471(A) 申请公布日期 2003.12.31
申请号 KR20020034860 申请日期 2002.06.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BOO, JAE PIL;LEE, HYEON SEONG;YOO, JUN GYU
分类号 B24B37/04;B24B57/02;H01L21/304;H01L21/306;(IPC1-7):H01L21/304 主分类号 B24B37/04
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