发明名称 |
POLISHING STATION OF CHEMICAL MECHANICAL POLISHING APPARATUS |
摘要 |
PURPOSE: A polishing station of a chemical mechanical polishing(CMP) apparatus is provided to prevent a wafer unloading error by stably unloading a semiconductor wafer from a transfer stage. CONSTITUTION: A turntable on which a polishing pad is mounted is formed on a polishing station. A polishing head(162) has a membrane(168) whose surface contacts the wafer, maintaining the wafer and pressing the wafer over the turntable. The polishing station includes a wafer transfer stage(120) for loading/unloading the wafer into/from the polishing head. The wafer transfer stage includes a pedestal(122) and a fluid supply apparatus. The wafer is placed on the pedestal. When the wafer is unloaded from the polishing head to the pedestal, the fluid supply apparatus supplies fluid to a gap between the wafer and the membrane to reduce the surface tension between the wafer and the membrane. |
申请公布号 |
KR20030097471(A) |
申请公布日期 |
2003.12.31 |
申请号 |
KR20020034860 |
申请日期 |
2002.06.21 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
BOO, JAE PIL;LEE, HYEON SEONG;YOO, JUN GYU |
分类号 |
B24B37/04;B24B57/02;H01L21/304;H01L21/306;(IPC1-7):H01L21/304 |
主分类号 |
B24B37/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|