发明名称 |
Method of forming a dielectric layer in a semiconductor device |
摘要 |
Semiconductor devices that utilize a silicon-containing dielectric layer are disclosed. In one embodiment, a silicon-containing material is deposited on a substrate. The deposited material is processed with a reactive agent to react with silicon atoms of the deposited material to form the dielectric layer. The silicon-containing dielectric layer provides for improved or smaller semiconductor devices by reducing leakage and increasing the dielectric constant.
|
申请公布号 |
US6670231(B2) |
申请公布日期 |
2003.12.30 |
申请号 |
US20020273667 |
申请日期 |
2002.10.18 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
POWELL DON CARL;MERCALDI GARRY ANTHONY |
分类号 |
H01L21/314;H01L21/316;H01L29/78;(IPC1-7):H01L21/823 |
主分类号 |
H01L21/314 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|