发明名称 Method of forming a dielectric layer in a semiconductor device
摘要 Semiconductor devices that utilize a silicon-containing dielectric layer are disclosed. In one embodiment, a silicon-containing material is deposited on a substrate. The deposited material is processed with a reactive agent to react with silicon atoms of the deposited material to form the dielectric layer. The silicon-containing dielectric layer provides for improved or smaller semiconductor devices by reducing leakage and increasing the dielectric constant.
申请公布号 US6670231(B2) 申请公布日期 2003.12.30
申请号 US20020273667 申请日期 2002.10.18
申请人 MICRON TECHNOLOGY, INC. 发明人 POWELL DON CARL;MERCALDI GARRY ANTHONY
分类号 H01L21/314;H01L21/316;H01L29/78;(IPC1-7):H01L21/823 主分类号 H01L21/314
代理机构 代理人
主权项
地址