发明名称 Method for fabricating devices in core and periphery semiconductor regions using dual spacers
摘要 For fabricating a first device within a core region and a second device within a periphery region, of a semiconductor substrate, disposable spacers having a first width are formed at sidewalls of a first gate stack of the core region and a second gate stack of the periphery region. Drain and source junctions of the second device are formed in the periphery region to the sides of the disposable spacers of the second gate stack. The disposable spacers are removed and permanent spacers having a second width are formed at the sidewalls of the first and second gate stacks, with the second width being less than the first width. Silicide is formed with an exposed portion of a drain bit line junction within the core region after forming the permanent spacers.
申请公布号 US6670227(B1) 申请公布日期 2003.12.30
申请号 US20030361455 申请日期 2003.02.10
申请人 ADVANCED MICRO DEVICES, INC. 发明人 THIO HSIAO-HAN;HO KEI-LEONG
分类号 H01L21/8234;H01L21/8247;H01L27/105;(IPC1-7):H01L21/823 主分类号 H01L21/8234
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