| 摘要 |
The invention relates to an X-ray examination apparatus in which the X-ray detector 1 and the X-ray source 2 are subject to keeping the temperature constant and to cooling by way of a common cooling circuit. To this end, a cooling medium of constant temperature is applied to the X-ray detector 1 in order to make the X-ray detector 1 operate at uniform ambient temperatures. The temperature of the cooling medium, thus increased a first time, still suffices to perform cooling of the X-ray source 2. Consequently, the heated cooling medium, after application to the X-ray detector 1, is applied to the X-ray source 2 where a second exchange of heat takes place, so that at the same time the X-ray source 2 is cooled without utilizing an additional cooling circuit. This offers the advantage that relevant X-ray examination apparatus may have a simple construction, that the electronic components used in the construction have a correspondingly prolonged service life due to the constant low temperature, and that the apparatus can operate with a higher mean power as a result of the cooling.
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