发明名称 Formation method of pattern
摘要 A pattern formation method includes: forming a photoresist layer of a positive type on a substrate; exposing to light and developing the photoresist layer using an inversion mask having an opening at a site where a pattern is desired to be formed finally, thereby forming an opening portion in the photoresist layer to expose the substrate; applying a non-photosensitive organic film on an entire surface of the resulting substrate, so that the non-photosensitive organic film is embedded in the opening portion; etching back an entire surface of the non-photosensitive organic film on the photoresist layer until the photoresist layer is exposed; and exposing to light and developing an entire surface of the photoresist layer to remove the photoresist layer, thereby obtaining the non-photosensitive organic film having the desired pattern.
申请公布号 US6670106(B2) 申请公布日期 2003.12.30
申请号 US20010799113 申请日期 2001.03.06
申请人 SHARP KABUSHIKI KAISHA 发明人 FUJIO MASAYUKI
分类号 G03F7/023;G03F7/00;G03F7/039;G03F7/095;G03F7/26;G03F7/40;G03F7/42;H01L21/027;H01L21/302;H01L21/3065;(IPC1-7):G03F7/00 主分类号 G03F7/023
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