发明名称 Double-ramp ADC for CMOS sensors
摘要 A double ramp ADC within an image sensor. The double ramp ADC divides the analog-to-digital conversion process into two steps. During the first step of the conversion, the ADC runs through the potential digital values roughly, using coarse counter steps, and maintains a coarse digital output value. During the second step, the ADC runs through the individual digital values within the range of values associated with the coarse digital value. Thus, the second step runs through the fine digital values associated with the coarse digital value. The coarse and fine digital values are output as the converted digital value of the analog input voltage. The double ramp ADC should reduce the analog-to-digital conversion cycle time by up to 2<(n/2-1) >times that of the conventional analog-to-digital conversion cycle using ramp ADCs, where n is a number of bits of digital output (i.e., resolution) of the ADCs.
申请公布号 US6670904(B1) 申请公布日期 2003.12.30
申请号 US20020225427 申请日期 2002.08.22
申请人 MICRON TECHNOLOGY, INC. 发明人 YAKOVLEV ALEXEY
分类号 H03M1/16;H03M1/56;(IPC1-7):H03M1/82 主分类号 H03M1/16
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