发明名称 |
Multi-walled carbon nanotube scanning probe apparatus having a sharpened tip and method of sharpening for high resolution, high aspect ratio imaging |
摘要 |
A method provides a sharpened Multi-Walled Carbon NanoTube Scanning Probe (MWCNT-SP) for a Atomic Force Microscopy (AFM). The MWCNT-SP is attached to a cantilever and help in the FMA. The tip of the MWCNT-SP is positioned in contact with a conducting substrate, and a voltage source is connected to the MWCNT-SP and to the substrate. The outer layers of the MWCNT-SP become hot, and the outermost carbon layers burns off, thereby creating a point on the MWCNT-SP.
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申请公布号 |
US2003233871(A1) |
申请公布日期 |
2003.12.25 |
申请号 |
US20030440050 |
申请日期 |
2003.05.16 |
申请人 |
ELORET CORPORATION |
发明人 |
NGUYEN CATTIEN V.;STEVENS RAMSEY M.D. |
分类号 |
G01Q60/24;G01Q70/12;G01Q70/16;(IPC1-7):G01N13/10 |
主分类号 |
G01Q60/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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