| 摘要 |
A semiconductor integrated circuit with built-in self-test function includes an I/O port which is connected to a pad and constituted of a port direction register; a port register; and a comparator, and a peripheral function block connected to the pad, and when it is intended to test an output of the peripheral function block, the semiconductor integrated circuit with built-in self-test function performs a test judgment by setting an expected value for the output of the peripheral function block in the port register, setting a value for setting the I/O port as an input port in the port direction register and making a comparison between a value output from the peripheral function block via the pad and the expected value set in the port register with the comparator.
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