发明名称 Manufacturing method for a semiconductor device
摘要 Position control of a crystal grain in accordance with an arrangement of a TFT is achieved, and at the same time, a processing speed during a crystallization process is increased. More specifically, there is provided a manufacturing method for a semiconductor device, in which crystal having a large grain size can be continuously formed through super lateral growth that is artificially controlled and substrate processing efficiency during a laser crystallization process can be increased. In the manufacturing method for a semiconductor device, instead of performing laser irradiation on an entire semiconductor film within a substrate surface, a marker as a reference for positioning is formed so as to crystallize at least an indispensable portion at minimum. Thus, a time period required for laser crystallization can be reduced to make it possible to increase a processing speed for a substrate. The above structure is applied to a conventional SLS method, so that it is possible to solve a problem inherent to the conventional SLS method, in that the substrate processing efficiency is poor.
申请公布号 US2003235971(A1) 申请公布日期 2003.12.25
申请号 US20020306345 申请日期 2002.11.29
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;SHIMOMURA AKIHISA;OHTANI HISASHI;HIROKI MASAAKI;TANAKA KOICHIRO;SHIGA AIKO;AKIBA MAI;KASAHARA KENJI
分类号 H01L29/786;H01L21/20;H01L21/77;H01L21/84;H01L23/544;H01L29/04;(IPC1-7):H01L21/20;H01L21/36 主分类号 H01L29/786
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