发明名称 A SELF-ALIGNED CROSS-POINT MRAM DEVICE WITH ALUMINUM METALLIZATION LAYERS
摘要 An MRAM device (160) and manufacturing process thereof having aluminum conductive lines (134) and (152), with self-aligning cross-points. Conductive lines (134) and metal stack (138) are patterned in a single patterning step and etched. Conductive lines (152) positioned orthogonally to conductive lines (134) are patterned simultaneously with the patterning of metal stack (138) and are etched. The metal stack (138) serves as an anti-reflective coating for conductive lines (152) during the etching process. A multi-level MRAM device may be manufactured in accordance with an embodiment of the invention.
申请公布号 WO02059941(A3) 申请公布日期 2003.12.24
申请号 WO2002US01923 申请日期 2002.01.24
申请人 INFINEON TECHNOLOGIES AG 发明人 NING, XIAN, J.
分类号 G11C11/15;H01L21/8246;H01L27/22 主分类号 G11C11/15
代理机构 代理人
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