发明名称 WAFER LOADING ERROR DETECTING APPARATUS OF SEMICONDUCTOR MANUFACTURING EQUIPMENT
摘要 PURPOSE: A wafer loading error detecting apparatus of semiconductor manufacturing equipment is provided to be capable of exactly sensing the distance length between wafers loaded at each slot of a cassette and minimizing the damage of the wafer. CONSTITUTION: A wafer loading failure detecting apparatus of a semiconductor manufacturing equipment is provided with a cassette having a plurality of slots spaced apart from each other, detecting parts(2,4) installed at the cassette for sensing the distance length between wafers, and a controller(6) for generating a driving control signal or an error signal according to the signal sensed from the detecting part. The wafer loading error detecting apparatus further includes a driving part(8) for generating a motor driving signal in response to the driving control signal of the controller and a lift part(12) for moving the cassette up and down by rotating a motor(10) in response to the motor driving signal of the driving part.
申请公布号 KR20030095528(A) 申请公布日期 2003.12.24
申请号 KR20020032772 申请日期 2002.06.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWON, O CHANG;WEE, SEONG HYEOK
分类号 H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/68
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