发明名称 |
WAFER LOADING ERROR DETECTING APPARATUS OF SEMICONDUCTOR MANUFACTURING EQUIPMENT |
摘要 |
PURPOSE: A wafer loading error detecting apparatus of semiconductor manufacturing equipment is provided to be capable of exactly sensing the distance length between wafers loaded at each slot of a cassette and minimizing the damage of the wafer. CONSTITUTION: A wafer loading failure detecting apparatus of a semiconductor manufacturing equipment is provided with a cassette having a plurality of slots spaced apart from each other, detecting parts(2,4) installed at the cassette for sensing the distance length between wafers, and a controller(6) for generating a driving control signal or an error signal according to the signal sensed from the detecting part. The wafer loading error detecting apparatus further includes a driving part(8) for generating a motor driving signal in response to the driving control signal of the controller and a lift part(12) for moving the cassette up and down by rotating a motor(10) in response to the motor driving signal of the driving part.
|
申请公布号 |
KR20030095528(A) |
申请公布日期 |
2003.12.24 |
申请号 |
KR20020032772 |
申请日期 |
2002.06.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KWON, O CHANG;WEE, SEONG HYEOK |
分类号 |
H01L21/68;(IPC1-7):H01L21/68 |
主分类号 |
H01L21/68 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|