发明名称 CONTACTOR OF SEMICONDUCTOR PACKAGE INSPECTION APPARATUS
摘要 PURPOSE: A contactor of a semiconductor package inspection apparatus is provided to be capable of preventing the inspection and result signals transmitted through neighboring contactors from electromagnetically influencing on each other. CONSTITUTION: A contactor of a semiconductor package inspection apparatus is provided with a wire(41) connected with a PCB(Printed Circuit Board) through its one side and connected with a pin of a semiconductor package(10) through its the other side, a shielding plate(51) for electromagnetically shielding neighboring wires, and an elastic part(61) for supplying elastic force to the wire in order to contact the pin of the semiconductor package. At this time, a cylindrical type conductive plate is used as the shielding plate. At the time, the shielding plate is coated with insulation material. Preferably, the contactor further includes a fixing part for fixing the shielding plate.
申请公布号 KR100414302(B1) 申请公布日期 2003.12.23
申请号 KR19960027899 申请日期 1996.07.11
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUN, JUN U
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
代理机构 代理人
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