| 摘要 |
<p>The present invention relates to methods and apparatus (40) for determining properties of wood specimens from scatter ellipses (20). Measures of grain angle, grain length and/or error can be obtained by analysing the scatter ellipse light intensity around one or more (49) constant radii. A ring of sensors (47) forms the constant radius. Maps of grain properties can be obtained of the surface of the specimen. From the map, the bulk properties of the specimen such as modulus of elasticity and the propensity to twist and warp, are determined.</p> |
