发明名称 APPARATUS AND METHOD FOR TESTING DVI OF LCD MODULE
摘要 PURPOSE: An apparatus and a method for testing a DVI of an LCD module are provided to display a picture of other application programs through a monitor by applying a test pattern at the same time with one graphic card, thereby easily executing a test. CONSTITUTION: A test computer(110) tests display characteristics of an LCD module(130) by applying a test pattern to the LCD module through a DVI(Digital Video Interactive) test board(120). The test computer includes a graphic card for a monitor(116) and a DVI graphic card for providing the test pattern. The DVI test board includes a TMDS(Transition Minimized Differential Signaling) receiver, a driving signal generator, and a buffer board. The TMDS receiver converts a TMDS signal received from the DVI graphic card into a TTL(Transistor Transistor Logic) signal. The driving signal generator provides a driving signal for driving the LCD module from the converted TTL signal. The buffer board provides the driving signal as the TTL signal, TMDS signal or LMDS(Local Multi-point Distribution Service) signal according to the liquid crystal display module.
申请公布号 KR20030095128(A) 申请公布日期 2003.12.18
申请号 KR20020032659 申请日期 2002.06.11
申请人 DONG A ELTEK CO., LTD. 发明人 PARK, JAE GYU
分类号 G02F1/13 主分类号 G02F1/13
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