发明名称 Automated test generation
摘要 A system and method for automated FVT test generation by distributed processing among a master (100) and one or more slave (200) JVMs which communicate via RMI. Using reflection analysis, the master (100) sequentially tests each of a plurality of classes, instructs the slave to test each of the plurality of classes, compares the results of the testing at the master and slave and in dependence thereon adds the class to a pool (110) of classes for subsequent use. This provides the advantage that the test application may be set running and allowed to continue automatically. The more objects that are serialised, the more variations and permutations can be tested and theoretically, there is no limit to the amount of testing that can be done. Rather than having a static set of tests that are run over and over, the tests are constantly changing which increases the likelihood of finding bugs.
申请公布号 US2003233635(A1) 申请公布日期 2003.12.18
申请号 US20020294979 申请日期 2002.11.14
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CORRIE BENJAMIN JOHN
分类号 G06F9/44;H02H3/05;(IPC1-7):G06F9/44 主分类号 G06F9/44
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