发明名称 CONTROLLED PENETRATION SUBPAD
摘要 <p>Provided is a seamless polishing pad comprising a seamless polishing layer (14) having a substantially uniform depth of penetration into a porous subpad (3). In one embodiment, the polishing pad comprises a polishing layer produced by applying to the subpad a hardenable fluid. In another embodiment, the subpad is coated with a barrier before coating with the hardenable fluid. In each embodiment, the depth of penetration of the polishing layer and/or barrier is substantially uniform. Also provided is a method of producing a seamless polishing pad comprising a seamless polishing layer having a substantially uniform depth of penetration into a porous subpad.</p>
申请公布号 WO2003103959(P1) 申请公布日期 2003.12.18
申请号 US2003018002 申请日期 2003.06.09
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