METHOD AND APPARATUS FOR DETERMINING WOOD PARAMETERS, INCLUDING GRAIN LENGTH

摘要

The present invention relates to a method and apparatus (30) for determining properties of wood specimens from scatter ellipses (35). Measures of grain length can be obtained by analysing the light 20 intensity attenuation along the major and minor axes (22, 24) of the scatter ellipse (35). Maps of grain length over the surface of the specimen can be obtained, and bulk properties of the specimen determined from the map. The modulus of elasticity and the propensity for the specimen to warp can be determined.