发明名称 Phase change memory cell and manufacturing method thereof using minitrenches
摘要 The phase change memory cell is formed by a resistive element and by a memory region of a phase change material. The resistive element has a first thin portion having a first sublithographic dimension in a first direction; and the memory region has a second thin portion having a second sublithographic dimension in a second direction transverse to the first dimension. The first thin portion and the second thin portion are in direct electrical contact and define a contact area of sublithographic extension. The second thin portion is delimited laterally by oxide spacer portions surrounded by a mold layer which defines a lithographic opening. The spacer portions are formed after forming the lithographic opening, by a spacer formation technique.
申请公布号 US2003231530(A1) 申请公布日期 2003.12.18
申请号 US20030372761 申请日期 2003.02.20
申请人 STMICROELECTRONICS S.R.L.;OVONYX INC. 发明人 BEZ ROBERTO;PELLIZZER FABIO;TOSI MARINA;ZONCA ROMINA
分类号 G11C11/56;H01L27/24;H01L45/00;(IPC1-7):G11C29/00 主分类号 G11C11/56
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