发明名称 SOLID-STATE DEVICE AND ITS MANUFACTURING METHOD
摘要 <p>The present invention provides a solid device having a layered structure inwhich a filmhaving a lowdielectric constant serves as an interlayer insulating film or a protective membrane which will hardly undergo separation, andmethod for fabrication thereof. <??>A boron-carbon-nitrogen film is used as interlayer insulating films 5A to 5C, and as a passivation membrane of a semiconductor device. <IMAGE></p>
申请公布号 EP1372188(A1) 申请公布日期 2003.12.17
申请号 EP20020701625 申请日期 2002.02.28
申请人 KABUSHIKI KAISHA WATANABE SHOKO;SUGINO, TAKASHI 发明人 SUGINO, TAKASHI;KUSUHARA, MASAKI;UMEDA, MASARU
分类号 H01L21/318;H01L21/768;H01L21/77;H01L21/84;H01L23/532;H01L27/06;H01L27/12;(IPC1-7):H01L21/314 主分类号 H01L21/318
代理机构 代理人
主权项
地址