发明名称 Ion implantation method for fabricating magnetoresistive (MR) sensor element
摘要 A method for forming a magnetoresistive (MR) layer first employs a substrate over which is formed a magnetoresistive (MR) layer formed of a magnetoresistive (MR) material. There is then ion implanted selectively, while employing an ion implant method, the magnetoresistive (MR) layer to form: (1) an ion implanted portion of the magnetoresistive (MR) layer formed of an ion implanted magnetoresistive (MR) material; and (2) an adjoining non ion implanted portion of the magnetoresistive (MR) layer formed of the magnetoresistive (MR) material, where the ion implanted magnetoresistive (MR) material is a non magnetoresistive (MR) material. The method may be employed for forming within magnetoresistive (MR) sensor elements magnetoresistive (MR) layers with enhanced dimensional uniformity, and in particular enhanced overlay dimensional uniformity.
申请公布号 US6663920(B2) 申请公布日期 2003.12.16
申请号 US20020100130 申请日期 2002.03.18
申请人 HEADWAY TECHNOLOGIES, INC. 发明人 HAN CHERNG-CHYI;XIAO RONG-FU;CHEN MAO-MIN;WANG PO-KANG
分类号 C23C14/48;H01F41/30;H01L21/8246;H01L27/22;H01L43/12;(IPC1-7):B05D3/06;B05D5/00;C23C14/18;C23C14/58 主分类号 C23C14/48
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