发明名称 |
Method and apparatus for evaluating and correcting the tester derating factor (TDF) in a test environment |
摘要 |
Tester derating factor (TDF) arrangements and methodologies providing improvements in semiconductor start-to-finish manufacturing arrangements, especially within DV testing and in the world of designing of devices and virtual simulation.
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申请公布号 |
US6665627(B2) |
申请公布日期 |
2003.12.16 |
申请号 |
US20010821112 |
申请日期 |
2001.03.30 |
申请人 |
INTEL CORPORATION |
发明人 |
JAIN SUNIL K.;CHEMA GREG P. |
分类号 |
G01R31/319;(IPC1-7):G06F19/00;G01N37/00 |
主分类号 |
G01R31/319 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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