发明名称 ISOLATION FORMATION METHOD OF SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING FLASH MEMORY CELL USING THE SAME
摘要 PURPOSE: A method of forming isolation layer of a semiconductor device and a method of manufacturing a flash memory cell using the same are provided to obtain uniform pattern on a substrate by narrowing a protruded isolation layer and to prevent occurring of moat by forming a liner oxide layer in the active region. CONSTITUTION: Stacked layers of tunnel oxide, sacrifice oxide and pad nitride having an open area of an isolation region are formed on a semiconductor substrate(100). After a trench is formed on the isolation region, an isolation layer is formed by burying insulation material in the isolation region. The pad nitride layer is then removed and the sacrifice oxide layer is oxidized to form a sacrifice silicon oxide layer(110). Etching is performed on the protruded part(109a) of the isolation layer to narrow width of the protrusion.
申请公布号 KR20030094440(A) 申请公布日期 2003.12.12
申请号 KR20020031261 申请日期 2002.06.04
申请人 HYNIX SEMICONDUCTOR INC. 发明人 DONG, CHA DEOK;LEE, SEUNG CHEOL
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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