发明名称 |
METHOD OF FORMING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of forming capacitor of a semiconductor device is provided to increase electric permittivity of the capacitor. CONSTITUTION: A lower electrode(150a) of capacitor is formed on a semiconductor substrate. The lower electrode(150a) includes a conductive carbon. A dielectric layer(160) containing an oxide material is formed on the lower electrode(150a) by the reaction with the surface of the lower electrode in gas phase. The formed dielectric layer(160) is Al2O3. After annealing the dielectric layer(160), an upper electrode(170) is formed on the dielectric layer.
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申请公布号 |
KR20030094428(A) |
申请公布日期 |
2003.12.12 |
申请号 |
KR20020031225 |
申请日期 |
2002.06.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KO, CHANG HYEON |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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