发明名称 METHOD AND APPARATUS FOR MONITORING TOOL PERFORMANCE
摘要 <p>A method and system for monitoring tool performance for processing tools in a semiconductor processing system. The semiconductor processing system includes a number of processing tools, a number of processing modules, a number of sensors, and an alarm management system. A tool health control strategy is executed in which tool health data for the processing tool is collected. A tool health analysis strategy is executed in which the tool health data is analyzed. An intervention manager can pause the processing tool when an alarm has occurred. The intervention manager refrains from pausing the proceesing tool when an alarm has not occurred.</p>
申请公布号 WO03103024(A2) 申请公布日期 2003.12.11
申请号 WO2003US16882 申请日期 2003.05.28
申请人 TOKYO ELECTRON LIMITED;FUNK, MERRITT;TOZAWA, MASAKI 发明人 FUNK, MERRITT;TOZAWA, MASAKI
分类号 H01L21/02;G05B19/4065;G06F19/00;H01L21/00;(IPC1-7):H01L21/00 主分类号 H01L21/02
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