| 摘要 |
<p>In one embodiment, an integrated circuit (10) which uses one or more re-useable modules (14, 16) may use a signature generated by a duplicate state machine (26, 28) or an unmodified state machine (20, 22) to select, control, or otherwise affect a resource on the integrated circuit (10), where affecting the resource was not part of the original design and state diagram of the unmodified state machine (20, 22). In one embodiment, a method and apparatus is provided for dynamically reconfiguring a plurality of test circuits in re-useable modules (14, 16) on an IC (10) without modifying the controller state machine (20, 22) in the re-usable module (14, 16).</p> |
