发明名称 CMP SYSTEM AND METHOD FOR EFFICIENTLY PROCESSING SEMICONDUCTOR WAFERS
摘要 A chemical mechanical polishing (CMP) system and method for efficiently processing semiconductor wafers utilizes wafer transfer mechanisms that are strategically positioned in the system to efficiently transfer the wafers through the system. The efficient transfer of semiconductor wafers within the CMP system reduces congestion of wafers at various units of the system, which increases the throughput of the system. In addition to the efficient transfer of semiconductor wafers, the strategic positioning of the wafer transfer mechanisms minimizes the footprint of the CMP system.
申请公布号 WO03011518(A9) 申请公布日期 2003.12.11
申请号 WO2002US23276 申请日期 2002.07.23
申请人 ORIOL, INC.;JEONG, IN-KWON 发明人 JEONG, IN-KWON
分类号 B24B37/04;H01L21/00;H01L21/677;(IPC1-7):B24B7/00;B24B9/00;B24B51/00;B24B1/00 主分类号 B24B37/04
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