发明名称 APPARATUS AND METHOD FOR INSPECTING ADHERING STATE OF PCB FOR BGA TYPE CHIP
摘要 PURPOSE: An apparatus and a method for inspecting an adhering state of a PCB(Printed Circuit Board) for BGA(Ball Grid Array) type chip are provided to decide the adhering state of balls on the PCB by utilizing an electrostatic discharge protection circuit. CONSTITUTION: An apparatus and a method for inspecting an adhering state of a PCB for BGA type chip includes a contact module(60), a measurement unit(64), and a decision unit(65). The contact module(60) includes a plurality of lead pins(69) which are inserted into a plurality of connection holes(61) of a PCB in order to be electrically connected to balls. The measurement unit(64) measures the electrical potential between the lead pins(69) and the ground. The decision unit(65) decides an adhering state of the balls on the PCB by using the measured electrical potential.
申请公布号 KR20030093744(A) 申请公布日期 2003.12.11
申请号 KR20020031587 申请日期 2002.06.05
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 NOH, JI MYEONG;YOO, TAE HWAN
分类号 G01R31/00;(IPC1-7):G01R31/00 主分类号 G01R31/00
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