发明名称 ALL PIN CHECK BOARD
摘要 PURPOSE: An all pin check board is provided to be capable of previously detecting a pin capable of being deviated from timing spec at all boards for improving the reliability of an equipment. CONSTITUTION: An all pin check board(20) is used for detecting a pin capable of being easily deviated from timing spec at a test system of an EDS(Electrical Die Sorting) test process. At this time, a circuit(22) is formed at the upper portion of the all pin check board for being capable of previously checking each board pin. At the time, the difference of signal timing, is generated between the first pin used at a related apparatus and the second pin unused at the related apparatus, so that the deviation of timing spec is checked by using the difference of the signal timing.
申请公布号 KR20030093559(A) 申请公布日期 2003.12.11
申请号 KR20020031144 申请日期 2002.06.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, CHEON SEOK;SEO, YONG DAE
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
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