发明名称 |
METHOD FOR FORMING CVD LAYER FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a CVD(Chemical Vapor Deposition) layer for manufacturing a semiconductor device is provided to be capable of forming a plurality of aiming CVD layers in one equipment at a time for reducing the loss of the equipment and preventing the increase of fabrication cost. CONSTITUTION: After forming an STI(Shallow Trench Isolation) layer at the upper portion of a silicon substrate by carrying out a BUC process, an STI UBUC layer is deposited on the entire surface of the resultant structure without the change of an equipment, so that a PE-TEOS(Plasma Enhanced-TetraEthylOrthoSilicate) depositing process is capable of being skipped. At this time, the BUC process is simultaneously carried out with a depositing process and an etching process. Preferably, the STI UBUC layer is made of the same or similar material of a PE-TEOS layer.
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申请公布号 |
KR20030093697(A) |
申请公布日期 |
2003.12.11 |
申请号 |
KR20020031510 |
申请日期 |
2002.06.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JONG SEOK;KIM, TAE HUN |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
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地址 |
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