| 摘要 |
<p>A system for arc detection testing using synthesized arcs is disclosed, which uses voltage and current waveform generators to generate an arc´s analog form voltage and current waveform from a digital form of the arc´s captured waveforms. A voltage waveform amplifier and a current waveform amplifier are included, with the outputs of the voltage and current waveform generators coupled to the input to inputs of the voltage and current waveform amplifiers, respectively. The outputs of the voltage and current waveform amplifiers are connected in circuit to a device under test to test the device's response to the waveforms. A method for testing a device's response to a simulated arcing condition is also disclosed. An electric arc´s voltage and current waveforms are captured in digital form. Analog form voltage and current waveform are generated from the captured digital voltage and current waveforms. The analog form voltage and current waveforms are applied to a device under test and the device is monitored to determine its response to the waveforms.</p> |
