发明名称 |
Method and apparatus for providing a preselected voltage to test or repair a semiconductor device |
摘要 |
A method and apparatus for providing a preselected voltage to test or repair a semiconductor device. The apparatus includes a one-stage pump and a transfer device. The one-stage pump is adapted to access a first voltage and provide a second voltage using the first voltage. The transfer device is capable of providing the first voltage to a node using the second voltage.
|
申请公布号 |
US2003229832(A1) |
申请公布日期 |
2003.12.11 |
申请号 |
US20020166192 |
申请日期 |
2002.06.10 |
申请人 |
CIOACA DUMITRU |
发明人 |
CIOACA DUMITRU |
分类号 |
G01R31/319;G11C29/56;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/319 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|