发明名称 |
Tunnel magnetoresistive effect element, method of manufacturing tunnel magnetoresistive effect element and magnetic memory device |
摘要 |
When a tunnel magnetoresistive effect element having a multilayer film structure containing two ferromagnetic material layers (11, 12) and a barrier layer (13) is constructed, after one ferromagnetic material layer (11) had been deposited, a conductive layer (16), formed by adding a material of an element different from a metal material to said metal material serving as a principal component thereof, is deposited on the ferromagnetic material layer (11) and the barrier layer (13) is formed by oxidizing the conductive layer (16), whereafter the other ferromagnetic material layer (12) is deposited on the barrier layer (13). Thus, in the tunnel magnetoresistive effect type memory device, dispersion of resistance value between respective elements can be suppressed while a large TMR ratio can be obtained.
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申请公布号 |
US2003227799(A1) |
申请公布日期 |
2003.12.11 |
申请号 |
US20030341857 |
申请日期 |
2003.01.14 |
申请人 |
HIGO YUTAKA;BESSHO KAZUHIRO;MIZUGUCHI TETSUYA;YAMAMOTO TETSUYA;HOSOMI MASANORI;OHBA KAZUHIRO;KANO HIROSHI |
发明人 |
HIGO YUTAKA;BESSHO KAZUHIRO;MIZUGUCHI TETSUYA;YAMAMOTO TETSUYA;HOSOMI MASANORI;OHBA KAZUHIRO;KANO HIROSHI |
分类号 |
G11B5/39;H01F10/32;H01F41/30;H01L21/8246;H01L27/105;H01L43/08;H01L43/12;(IPC1-7):G11C7/00 |
主分类号 |
G11B5/39 |
代理机构 |
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代理人 |
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地址 |
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