METHOD OF AND APPARATUS FOR THE MEASUREMENT OF PHYSICAL CHARACTERISTICS OF X-RAYS,IN PARTICULAR OF GAMMA-RAYS,AND ITS APPLICATION,申请号USD3535520-传众专利搜索

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发明名称	METHOD OF AND APPARATUS FOR THE MEASUREMENT OF PHYSICAL CHARACTERISTICS OF X-RAYS,IN PARTICULAR OF GAMMA-RAYS,AND ITS APPLICATION
摘要
申请公布号	US3535520(A)	申请公布日期	1970.10.20
申请号	USD3535520	申请日期	1964.11.09
申请人	OSTERREICHISCHE STUDIENGESELLSCHAFT FUR ATOMENERGIE GMBH.	发明人	MICHAEL J. HIGATSBERGER;PETER WEINZIERL;HARALD P. HICK
分类号	G01T1/24;G01T1/36	主分类号	G01T1/24
代理机构		代理人
主权项
地址

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