发明名称 Nonvolatile ferroelectric memory control device
摘要 The present invention generally relates to nonvolatile ferroelectric memory control devices, and more specifically, to a nonvolatile ferroelectric memory control device suitable for an embedded memory. In the nonvolatile ferroelectric memory control device of the present invention, a column address area is arranged in the least significant bit region. When a column address is accessed in the same row address, an address transition detecting signal is not generated. According to the present invention, an internal data register array is arranged and a repeated access address controls the data register array so that data stored in the register may be immediately outputted. Accordingly, the nonvolatile ferroelectric memory control device of the present invention can reduce power consumption when the FRAM is used as a program memory in a SOC (System on Chip) structure and extends life of FRAM by decreasing power stress applied to cells.
申请公布号 US6661698(B1) 申请公布日期 2003.12.09
申请号 US20020330062 申请日期 2002.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG HEE BOK
分类号 G11C11/22;(IPC1-7):G11C11/22 主分类号 G11C11/22
代理机构 代理人
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