发明名称 Particle analyzer and particle classifying method
摘要 A particle analyzer includes a detecting section for detecting at least two kinds of parameters from a plurality of particles included in a sample, the two kinds of parameters representing characteristics of each particle, a processing section for processing the parameters detected by the detecting section; and an output section for outputting a result processed by the processing section, wherein the processing section includes a distribution chart creating section for creating a scattergram of the particles based on the detected parameters, a region presetting section for presetting a particle distribution region in the created scattergram, and a classifying section for calculating a classifying line corresponding to a particle distribution state in the preset particle distribution region and for classifying the particles on the scattergram by the calculated classifying line.
申请公布号 US6662117(B2) 申请公布日期 2003.12.09
申请号 US20010910878 申请日期 2001.07.24
申请人 SYSMEX CORPORATION 发明人 NAITO TAKAMICHI
分类号 G01N33/48;G01N15/14;G01N33/49;(IPC1-7):G06K9/00 主分类号 G01N33/48
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