发明名称 Double planar gated SOI MOSFET structure
摘要 A double gated silicon-on-insulator (SOI) MOSFET is fabricated by using a mandrel shallow trench isolation formation process, followed by a damascene gate. The double gated MOSFET features narrow diffusion lines defined sublithographically or lithographically and shrunk, damascene process defined by an STI-like mandrel process. The double gated SOI MOSFET increases current drive per layout width and provides low out conductance.
申请公布号 US6660596(B2) 申请公布日期 2003.12.09
申请号 US20020064318 申请日期 2002.07.02
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ADKISSON JAMES W.;BRACCHITTA JOHN A.;ELLIS-MONAGHAN JOHN J.;LASKY JEROME B.;LEOBANDUNG EFFENDI;PETERSON KIRK D.;RANKIN JED H.
分类号 H01L21/336;H01L21/762;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L21/336 主分类号 H01L21/336
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