发明名称 Transistor in semiconductor devices
摘要 The present invention relates to a transistor in a semiconductor device and method of manufacturing the same. According to the present invention, the transistor has an auxiliary electrode to which a voltage is applied apart from a gate electrode and formed at both sides of the gate electrode. In a transistor that is turned on/off depending on a voltage applied to the gate electrode, a region where the gate electrode and the source/drain overlap is maintained to have the same voltage by the auxiliary electrode by always applying a high voltage to the auxiliary electrode upon an on operation of the transistor even when the gate electrode becomes a zero (0) volt upon a refresh operation of a DRAM device. Therefore, the present invention can prevent generation of GIDL current. Further, even though the gate electrode is continuously turned on/off, the auxiliary electrode always maintains the same voltage between the gate electrode and the bit line. Therefore, the present invention can generation of a coupling noise due a shielding effect.
申请公布号 US6661055(B2) 申请公布日期 2003.12.09
申请号 US20010026955 申请日期 2001.12.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SUH JAI BUM
分类号 H01L21/28;G11C11/406;H01L21/336;H01L21/768;H01L21/8242;H01L27/108;H01L29/417;H01L29/49;H01L29/78;(IPC1-7):H01L29/76 主分类号 H01L21/28
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